Availabele with various chambers, analysis systems, stages and other options to suit the customer’s needs
MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance electronics for faster image acquisition, an ultra-fast scanning system with compensation for static and dynamic image aberrations or built-in scripting for user-defined applications, all the while maintaining the best price to performance ratio.

The MIRA series was designed with respect to a wide range of SEM applications and needs in today’s research and industry. Its excellent resolution at high beam currents has proved to be advantageous for analytical applications such as EBSD,WDX, etc. MIRA3 field emission scanning electron microscopes are manufactured in configurations with LM, XM and GM chambers.
  • Modern Optics
  • Rapid Maintenance
  • Automated Procedures
  • User-Friendly Software and Software tools

Documents for download

MIRA3 Brochure
3rd Generation of MIRA FE-SEMs - Download MIRA3 Brochure!