Toggle navigation
Home
Applications
Materials Science
Life Sciences
Semiconductors
Earth Sciences
Technology
SEM
MAIA3
VEGA3
MIRA3
FIB-SEM
XEIA3
GAIA3
FERA3
LYRA3
Light Microscopy
Q-PHASE: Quantitative, label-free imaging cytometry
Special Solutions
TIMA-X
TESCAN SEM/FIB-SEM with integrated Raman spectrometry
About TESCAN UK
News
Events
Contact
Tescan
/
Technology
/
SEM
/
MIRA3
MIRA3
Availabele with various chambers, analysis systems, stages and other options to suit the customer’s needs
MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance electronics for faster image acquisition, an ultra-fast scanning system with compensation for static and dynamic image aberrations or built-in scripting for user-defined applications, all the while maintaining the best price to performance ratio.
The MIRA series was designed with respect to a wide range of SEM applications and needs in today’s research and industry. Its excellent resolution at high beam currents has proved to be advantageous for analytical applications such as EBSD,WDX, etc. MIRA3 field emission scanning electron microscopes are manufactured in configurations with LM, XM and GM chambers.
Modern Optics
Rapid Maintenance
Automated Procedures
User-Friendly Software and Software tools
MIRA3
Documents for download
MIRA3 Brochure
3rd Generation of MIRA FE-SEMs - Download MIRA3 Brochure!
pdf – 7.1 MB
×
Download : MIRA3 Brochure
Email
*
Name
Surname
Market segment
- choose segment -
Materials Science
Life Sciences
Semiconductors
Earth Sciences
BOOK a DEMO!
Are you interested in more detailed information? Continue to the TESCAN global.
Do you have any questions? Do not hesitate to contact us!