News

TESCAN Introduces the new GAIA3 FIB-SEM workstation
TESCAN, a leading provider of charged particle technology and FIB-SEM...
Sep/04/2014
Analytical workshop brought WDS experts to Brno
TESCAN in cooperation with Thermo Scientific hosted a successful analytical...
Jul/15/2014
New subsidiary - TESCAN ORSAY FRANCE
TESCAN ORSAY HOLDING has been expanding manufacturing capacities as well as...
Jun/06/2014
CryoSEM workshop organized in cooperation with Leica Microsystems was successful
A one-day workshop focused on cryo-scanning electron microscopy (Cryo-SEM...
May/21/2014
Static acquisition geometry for true 3D EDS and 3D EBSD
TESCAN, a renowned brand of scanning electron microscopes and focused ion...
Mar/31/2014
TESCAN ORSAY HOLDING, a.s. and WITec GmbH launch the RISE Microscope for Correlative Raman-SEM Imaging at Analytica 2014
TESCAN ORSAY HOLDING, a.s., a multinational company experienced in charged...
Mar/25/2014
New R-STEM Detector
TESCAN proudly introduces New Retractable STEM Detector "R-STEM Detector...
Mar/13/2014
TESCAN Restructures in the UK after Merger
TESCAN, a leading global supplier of scanning electron microscopes and...
Dec/13/2013
New EBIC Detector by TESCAN
The innovative solution from TESCAN does not only focus on a single EBIC...
Dec/11/2013
Combination of orthogonal TOF-SIMS with FIB-SEM by TESCAN captured interest of scientists in Korea
Institute of Photonics and Electronics (ÚFE) in collaboration with scientists...
Nov/21/2013
Best Poster Presentation Award on the Intermetallics Conference 2013
Poster presenting the results of Cyclic Plasticity and Strain Localization...
Oct/08/2013