News

TESCAN at Pittcon 2017
The exhibition took place from March 6th-9th, 2017
Mar/15/2017
Low-cost adsorbents for cleaning contaminated waters
Characterisation of rice husks with TESCAN SEM VEGA3 XMU
Mar/15/2017
Development of mineral classification schemes
Classifying minerals of Brazilian provenance with TIMA
Mar/10/2017
TESCAN solution for large wafer inspection
High Resolution Large Format Imaging for Die Inspection  
Mar/09/2017
Plasma FIB and failure analysis in semiconductors
Visualization of doped active regions in semiconductor devices
Mar/09/2017
TESCAN TIMA-X installed in Tanzania
African Minerals and Geosciences Centre has new scanning electron microscope
Mar/06/2017
EDS and EBSD on the FIB-SEM workstation workshop
Joint TESCAN and EDAX workshop at the University of Maryland
Mar/03/2017
New application example on FIB-SEM tomography
Check out the new application example on FIB-SEM tomography of wood revealing...
Mar/02/2017
Developing new nano- and photo-catalysts
TESCAN FIB-SEM FERA3 used for morphological and elemental composition...
Mar/01/2017
Workshop at Colorado School of Mines
TESCAN TIMA in action
Feb/28/2017